The image shows the results of an analysis with an X-ray fluorescence (XRF) spectrometer. This method uses X-rays to excite electrons in the atoms of a sample, generating characteristic secondary X-rays that identify elements present and their concentrations.

In the table in the image, several elements are listed along with their percentages and an estimate of the associated error. Here are the elements with their respective percentages:

Karat: 1.49%

Au (Gold): 6.21%

Ag (Silver): 2.33%

Pd (Palladium): 2.42%

Rh (Rhodium): 2.68%

Ru (Ruthenium): 3.38%

Cd (Cadmium): 4.71%

Fe (Iron): 1.03%

Zn (Zinc): 70.30%

In (Indian): 2.55%

The errors associated with each percentage are shown in the "+2σ" column, indicating the standard deviation.

The XRF method is used to analyze the composition of metals and other materials, allowing the purity and characteristics of a sample to be identified without damaging it.